
Interconnect Reliability in Advanced Memory Device Packaging
This book explains mechanical and thermal reliability for modern memory packaging, considering materials, processes, and manufacturing.
In the past 40 years, memory packaging processes have evolved enormously.
- Kirjailija
- Chong Leong Gan, Chen-Yu Huang
- Painos
- 2023 ed.
- ISBN
- 9783031267109
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 30.4.2024
- Kustantaja
- Springer International Publishing AG
- Sivumäärä
- 210