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Interconnect Reliability in Advanced Memory Device Packaging
Tallenna

Interconnect Reliability in Advanced Memory Device Packaging

This book explains mechanical and thermal reliability for modern memory packaging, considering materials, processes, and manufacturing.

In the past 40 years, memory packaging processes have evolved enormously.

Painos
2023 ed.
ISBN
9783031267109
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
30.4.2024
Sivumäärä
210