Tallenna
Integrated Uncertainty Management and Applications
The 2010 International Symposium on Integrated Uncertainty Management and Applications (IUM'2010), which takes place at the Japan Advanced Institute of Science and Technology (JAIST), Ishikawa, Japan, between 9th-11th April, is conceived as a forum for the discussion and exchange of research results.
- Toimittaja
- Van-Nam Huynh, Yoshiteru Nakamori, Jonathan Lawry, Masahiro Inuiguchi
- Painos
- 2010 ed.
- ISBN
- 9783642119590
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 5.3.2010
- Sivumäärä
- 560
