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High-Resolution Imaging and Spectrometry of Materials
Tallenna

High-Resolution Imaging and Spectrometry of Materials

This book gives a survey of, and systematic introduction to, high-resolution electron microscopy. The method is thoroughly discussed; the latest developments are reported; and applications to surface and interface analysis and to the study of hidden structures are detailed. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.
Painos
Softcover reprint of hardcover 1st ed. 2003
ISBN
9783642075254
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
1.12.2010
Sivumäärä
442