Tallenna
High Resolution Focused Ion Beams: FIB and its Applications
In this book, we have attempted to produce a reference on high resolution focused ion beams (FIBs) that will be useful for both the user and the designer of FIB instrumentation.
- Alaotsikko
- The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology
- Kirjailija
- Jon Orloff, Lynwood Swanson, Mark Utlaut
- Painos
- Softcover reprint of the original 1st ed. 2003
- ISBN
- 9781461352297
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 20.9.2012
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 304
