Tallenna
Helium Ion Microscopy
Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions – such as the Helium Ion Microscope (HIM) – are destined to become the imaging tools of choice for the 21st century.
- Alaotsikko
- Principles and Applications
- Kirjailija
- David C. Joy
- Painos
- 2013 ed.
- ISBN
- 9781461486596
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 14.9.2013
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 64
