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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Kirjailija:
sidottu, 2009
englanti
The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Kirjailija
Patrick Echlin
Painos
2009 ed.
ISBN
9780387857305
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
19.3.2009
Sivumäärä
332