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Fundamentals of Nanoscale Film Analysis
Tallenna

Fundamentals of Nanoscale Film Analysis

sidottu, 2007
englanti
It describes characterization techniques to quantify the structure, composition and depth distribution of materials with the use of energetic particles and photons.

The book describes the fundamentals of materials characterization from the standpoint of the incident photons or particles which interrogate nanoscale structures.

Painos
2007 ed.
ISBN
9780387292601
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
16.2.2007
Sivumäärä
336