Tallenna
Fundamentals of Electromigration-Aware Integrated Circuit Design
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.
- Kirjailija
- Jens Lienig, Matthias Thiele
- Painos
- Softcover Reprint of the Original 1st 2018 ed.
- ISBN
- 9783030088118
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 14.12.2018
- Kustantaja
- Springer Nature Switzerland AG
- Sivumäärä
- 159
