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Fundamental Physics in Particle Traps
Tallenna

Fundamental Physics in Particle Traps

They are key to various aspects within metrology such as mass measurements and time standards, as well as promising to further developments in quantum information processing.

The reader obtains a valuable source of information suited for beginners and experts with an interest in fundamental studies using particle traps.

Painos
Softcover reprint of the original 1st ed. 2014
ISBN
9783662511732
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
27.8.2016
Sivumäärä
411