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Fundamental Physics in Particle Traps
Tallenna

Fundamental Physics in Particle Traps

They are key to various aspects within metrology such as mass measurements and time standards, as well as promising to further developments in quantum information processing.

The reader obtains a valuable source of information suited for beginners and experts with an interest in fundamental studies using particle traps.

ISBN
9783642452000
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
7.2.2014
Sivumäärä
411