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Fundamental Aspects of Silicon Oxidation
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Fundamental Aspects of Silicon Oxidation

Although structural characterization of bulk silicon oxides and electrical characterization of thin oxides and their interfaces with silicon have produced an extensive body of work over more than forty years, a mechanis­ tic understanding of the initial oxidation processes has remained elusive.
Toimittaja
Yves J. Chabal
Painos
Softcover reprint of the original 1st ed. 2001
ISBN
9783642625831
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
5.10.2012
Sivumäärä
262