Siirry suoraan sisältöön
From scientific instrument to industrial machine
Tallenna

From scientific instrument to industrial machine

Architectural stress is the inability of a system design to respond to new market demands. It is an important yet often concealed issue in high tech systems. In this book, the authors look at the phenomenon of architectural stress in embedded systems in the context of a transmission electron microscope system built by FEI Company.
Alaotsikko
Coping with architectural stress in embedded systems
Painos
2012 ed.
ISBN
9789400741461
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
29.4.2012
Kustantaja
Springer
Sivumäärä
112