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Field Emission Scanning Electron Microscopy
Tallenna

Field Emission Scanning Electron Microscopy

This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution.

Alaotsikko
New Perspectives for Materials Characterization
Painos
1st ed. 2018
ISBN
9789811044328
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
6.10.2017
Sivumäärä
137