
Field Emission Scanning Electron Microscopy
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution.
- Alaotsikko
- New Perspectives for Materials Characterization
- Kirjailija
- Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
- Painos
- 1st ed. 2018
- ISBN
- 9789811044328
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 6.10.2017
- Kustantaja
- Springer Verlag, Singapore
- Sivumäärä
- 137