Tallenna
Electron Nano-imaging
In this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advancement of electron microscopy such as differential phase contrast (DPC) STEM, sparse-coding image processing and quantum electron microscopy have been supplemented with further details.
- Alaotsikko
- Basics of Imaging and Diffraction for TEM and STEM
- Kirjailija
- Nobuo Tanaka
- Painos
- Second Edition 2024
- ISBN
- 9784431569398
- Kieli
- englanti
- Paino
- 446 grammaa
- Julkaisupäivä
- 3.8.2024
- Kustantaja
- SPRINGER VERLAG, JAPAN
- Sivumäärä
- 384
