Tallenna
Electromigration and Electronic Device Degradation
sidottu, 1994
englanti
Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.
- Toimittaja
- Aris Christou
- ISBN
- 9780471584896
- Kieli
- englanti
- Paino
- 680 grammaa
- Julkaisupäivä
- 7.2.1994
- Kustantaja
- John Wiley Sons Inc
- Sivumäärä
- 360
