Tallenna
Elastic and Inelastic Scattering in Electron Diffraction and Imaging
Kirjailija:
sidottu, 2025
englanti
Originally published in 1995, the first edition systematically summarized various dynamic theories associated with quantitative electron microscopy and their applications in simulations of electron diffraction patterns and images.
- Kirjailija
- Zhong Lin Wang
- Painos
- Second Edition 2025
- ISBN
- 9783031908187
- Kieli
- englanti
- Paino
- 446 grammaa
- Julkaisupäivä
- 2.11.2025
- Kustantaja
- Springer International Publishing AG
- Sivumäärä
- 495
