Tallenna
Digital Noise Monitoring of Defect Origin
Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others.
- Kirjailija
- Telman Aliev
- Painos
- 1st ed. Softcover of orig. ed. 2007
- ISBN
- 9781441944108
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 24.11.2010
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 224
