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Diffraction from Materials
Tallenna

Diffraction from Materials

With new tools such as the high-resolution electron microscope, new detectors, new techniques (such as EXAFS and glancing angle diffraction) and the new sources, the horizons of this field greatly expanded in the 1950's and 60's.
Painos
Second Edition 1987
ISBN
9783642829291
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
13.7.2013
Sivumäärä
591