Tallenna
Delay Fault Testing for VLSI Circuits
In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest.
- Kirjailija
- Angela Krstic
- Painos
- Softcover reprint of the original 1st ed. 1998
- ISBN
- 9781461375616
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 12.10.2012
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 191
