Siirry suoraan sisältöön
Defects in SiO2 and Related Dielectrics: Science and Technology
Defects in SiO2 and Related Dielectrics: Science and Technology
Tallenna

Defects in SiO2 and Related Dielectrics: Science and Technology

292,20 €
Lue Adobe DRM-yhteensopivassa e-kirjojen lukuohjelmassaTämä e-kirja on kopiosuojattu Adobe DRM:llä, mikä vaikuttaa siihen, millä alustalla voit lukea kirjaa. Lue lisää
Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.
ISBN
9789401009447
Kieli
englanti
Julkaisupäivä
6.12.2012
Formaatti
  • PDF - Adobe DRM
Lue e-kirjoja täällä
  • Lue e-kirja mobiililaitteella/tabletilla
  • Lukulaite
  • Tietokone