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Defects and Properties of Semiconductors
Tallenna

Defects and Properties of Semiconductors

Defect study in semiconductor engineering started originally with seeking methods how to suppress generation of harmful defects during device processing in order to achieve a high yield of device fabrication.
Alaotsikko
Defect Engineering
Painos
Softcover reprint of the original 1st ed. 1987
ISBN
9789401086165
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
25.12.2011
Kustantaja
Springer
Sivumäärä
300