
Deep Learning for Advanced X-ray Detection and Imaging Applications
This book provides a comprehensive overview of the latest advances in applying Artificial Intelligence (AI) to advanced X-ray imaging, with a particular focus on its medical applications.
- Toimittaja
- Krzysztof (Kris) Iniewski, Liang (Kevin) Cai
- Painos
- 2024 ed.
- ISBN
- 9783031756528
- Kieli
- englanti
- Paino
- 446 grammaa
- Julkaisupäivä
- 23.1.2025
- Kustantaja
- Springer International Publishing AG
- Sivumäärä
- 261