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Crustal Structure and Deep Deformation of the Chinese Mainland
Tallenna

Crustal Structure and Deep Deformation of the Chinese Mainland

Crustal Structure and Deep Deformation of the Chinese Mainland: Evidence from Deep Seismic Reflection Profiles and Other Geophysical Data Sets collects all available seismic reflection experiments that have been carried out in the Chinese mainland since the 1990s. Such data sheds light on the crustal-scale structure of major tectonic units in the Chinese mainland which reflect typical tectonic belts seen worldwide. Including full analysis and applications of the data as well as high-resolution images of the seismic reflection profiles themselves, this book provides valuable insight that can be applied globally for geologists, geophysicists and seismologists studying crustal structure and tectonics. Data from the Tibetan Plateau, which contains double normal thickness crust, is particularly valuable in providing details and an understanding of ongoing continent-continent collision.
Alaotsikko
Evidence from Deep Seismic Reflection Profiles and Other Geophysical Data Sets
Toimittaja
Rui Gao
ISBN
9780128135594
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
1.7.2022
Sivumäärä
400