Tallenna
Charged Semiconductor Defects
Kirjailija:
nidottu, 2010
englanti
“Charged Defects in Semiconductors” details the current state of knowledge regarding the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors.
- Alaotsikko
- Structure, Thermodynamics and Diffusion
- Kirjailija
- Edmund G. Seebauer, Meredith C. Kratzer
- Painos
- Softcover reprint of hardcover 1st ed. 2009
- ISBN
- 9781849968201
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 22.10.2010
- Kustantaja
- Springer London Ltd
- Sivumäärä
- 298
