Tallenna
Charged Semiconductor Defects
Kirjailija:
sidottu, 2008
englanti
“Charged Defects in Semiconductors” details the current state of knowledge regarding the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors.
- Alaotsikko
- Structure, Thermodynamics and Diffusion
- Kirjailija
- Edmund G. Seebauer, Meredith C. Kratzer
- Painos
- 2009 ed.
- ISBN
- 9781848820586
- Kieli
- englanti
- Paino
- 446 grammaa
- Julkaisupäivä
- 1.12.2008
- Kustantaja
- Springer London Ltd
- Sivumäärä
- 298
