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Characterization Problems Associated with the Exponential Distribution
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Characterization Problems Associated with the Exponential Distribution

Problems of calculating the reliability of instruments and systems and the development of measures to increase efficiency and reduce operational costs confronted physicists and mathe­ maticians at the end of the '40's and the beginning of the '50's in connection with the unrelia­ bility of electro-vacuum instruments used in aviation.
Kääntäjä
M. Stein
Toimittaja
I. Olkin
Painos
Softcover reprint of the original 1st ed. 1986
ISBN
9781461293743
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
1.10.2011
Sivumäärä
137