Tallenna
Characterization of Crystal Growth Defects by X-Ray Methods
This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979.
- Kirjailija
- B.K. Tanner
- Painos
- Softcover reprint of the original 1st ed. 1980
- ISBN
- 9781475711288
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 16.12.2012
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 589
