Tallenna
Characterization Methods for Submicron MOSFETs
nidottu, 2011
englanti
The need for more deep and extensive characterization of MOSFET param eters has further increased as the applications of this device have gained ground in many new fields in which its performance has become more and more sensi tive to the properties of its Si - Si0 interface.
- Toimittaja
- Hisham Haddara
- Painos
- Softcover reprint of the original 1st ed. 1995
- ISBN
- 9781461285847
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 26.9.2011
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 232
