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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
Tallenna

Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis

The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.
Painos
2002 ed.
ISBN
9780306458965
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
31.10.1998
Sivumäärä
430