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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Tallenna

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor.
Alaotsikko
A User-Oriented Guide
Painos
2013 ed.
ISBN
9783642431739
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
9.11.2014
Sivumäärä
528