Siirry suoraan sisältöön
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Tallenna

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

384,40 €
Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor.
Alaotsikko
A User-Oriented Guide
Painos
2013 ed.
ISBN
9783642273803
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
25.10.2012
Sivumäärä
528