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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Tallenna

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor.
Alaotsikko
A User-Oriented Guide
Painos
2013 ed.
ISBN
9783642273803
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
25.10.2012
Sivumäärä
528