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Atomic Force Microscopy in Nanobiology

207,20 €

Recent developments in atomic force microscopy (AFM) have been accomplished through various technical and instrumental innovations, including high-resolution and recognition imaging technology under physiological conditions, fast-scanning AFM, and general methods for cantilever modification and force measurement. All these techniques are now highly

Toimittaja
Kunio Takeyasu
ISBN
9789814411592
Kieli
englanti
Julkaisupäivä
19.4.2016