Tallenna
Atomic Force Microscopy Based Nanorobotics
Kirjailija:
nidottu, 2014
englanti
The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s.
- Alaotsikko
- Modelling, Simulation, Setup Building and Experiments
- Kirjailija
- Hui Xie, Cagdas Onal, Stéphane Régnier, Metin Sitti
- Painos
- 2012 ed.
- ISBN
- 9783642445019
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 26.11.2014
- Sivumäärä
- 344
