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Atom Probe Field Ion Microscopy
Tallenna

Atom Probe Field Ion Microscopy

This book provides a definitive account of the theory, practice and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. Recent advances in the method,which are largely due to the present authors, now permit the atomic-scale chemistry of a solid specimen to be recognised in three dimensions. As a result of these developments, new and exciting applications are rapidly emerging in the field of material science, surface science, and catalysis. The book is a state-of-the art account of this important field, and is intended for a graduate-level readership.
ISBN
9780198513872
Kieli
englanti
Paino
1042 grammaa
Julkaisupäivä
19.9.1996
Kustantaja
Clarendon Press
Sivumäärä
520