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Assessing Fault Model and Test Quality
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Assessing Fault Model and Test Quality

129,70 €
For many years, the dominant fault model in automatic test pattern gen­ eration (ATPG) for digital integrated circuits has been the stuck-at fault model.
Painos
Softcover reprint of the original 1st ed. 1992
ISBN
9781461366027
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
27.9.2012
Sivumäärä
132