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Applied Scanning Probe Methods XII
Tallenna

Applied Scanning Probe Methods XII

sidottu, 2008
englanti
Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties.
Alaotsikko
Characterization
Painos
2009 ed.
ISBN
9783540850380
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
4.11.2008
Sivumäärä
224