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Applied Scanning Probe Methods VIII
Tallenna

Applied Scanning Probe Methods VIII

sidottu, 2008
englanti
The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol.
Alaotsikko
Scanning Probe Microscopy Techniques
Painos
2008 ed.
ISBN
9783540740797
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
10.1.2008
Sivumäärä
465