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Applied Scanning Probe Methods II
Tallenna

Applied Scanning Probe Methods II

sidottu, 2006
englanti
These were quickly followed by the M- netic Force Microscope, MFM, and the Electrostatic Force Microscope, EFM. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.
Alaotsikko
Scanning Probe Microscopy Techniques
ISBN
9783540262428
Kieli
englanti
Paino
446 grammaa
Julkaisupäivä
21.2.2006
Sivumäärä
420