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An Artificial Intelligence Approach to Test Generation
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An Artificial Intelligence Approach to Test Generation

I am indebted to my thesis advisor, Michael Genesereth, for his guidance, inspiration, and support which has made this research possible. This research was supported by Schlumberger Palo Alto Research (previously Fairchild Laboratory for Artificial Intelligence).
Kirjailija
Narinder Singh
Painos
Softcover reprint of the original 1st ed. 1987
ISBN
9781461291831
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
5.10.2011
Sivumäärä
194