Siirry suoraan sisältöön
Advances in X-Ray Analysis
Tallenna

Advances in X-Ray Analysis

The featured subject of the 1966 Denver X-Ray Conference was X-Ray Diffraction Topography and Dynamical X-Ray Phenomena. One of the chairmen of the featured ses­ sions, Professor R. A. Young, made the following remarks at the conclusion of his session. We think they are quite appropriate to the occasion and with his permission we reproduce them here.
Alaotsikko
Volume 10
Painos
Softcover reprint of the original 1st ed. 1967
ISBN
9781468478372
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
12.6.2012
Sivumäärä
558