Advances in x-Ray Analysis
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Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6
- Alaotsikko
- Proccedings of the Forty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, Colorado, August 2-6,
- Toimittaja
- C.C. Goldsmith, San Jose, CA, USA) Ting C. Huang (IBM Almaden Research Center, Newton Square, Pennsylvania, USA) Ron Jenkins (International Centre for Diffraction Data, Yorktown Heights, NY, USA) I. Cev Noyan (IBM Research Center
- ISBN
- 9780306449017
- Kieli
- englanti
- Paino
- 1592 grammaa
- Julkaisupäivä
- 30.9.1994
- Kustantaja
- Kluwer Academic Publishers Group
- Sivumäärä
- 778
