Tallenna
Advances in X-ray Analysis
sidottu, 1993
englanti
Proceedings of the 41st Annual Conference on Applications of X-ray Analysis, held at Colorado Springs, Colorado in August 1992. The volume is divided into ten sections: mathematical techniques in x-ray spectrometry; analysis of light elements by x-ray spectrometry; XRS techniques and instrumentation
- Toimittaja
- John V. Gilfrich
- ISBN
- 9780306445712
- Kieli
- englanti
- Paino
- 446 grammaa
- Julkaisupäivä
- 1.10.1993
- Kustantaja
- Kluwer Academic / Plenum Publishers
- Sivumäärä
- 678
