Tallenna
Advances in Metrology
It highlights and discusses the recent technological advancements and developments in the areas of fundamental and quantum metrology, physico-mechanical and electrical metrology, time and frequency metrology, materials metrology, industrial and legal metrology, and digital metrology, gas and aerosol metrology among others.
- Alaotsikko
- Select Proceedings of AdMet 2024
- Toimittaja
- Sanjay Yadav, Naveen Garg, Mukesh Kumar, Shankar G. Aggarwal, Shiv Kumar Jaiswal, Manoj Kumar
- ISBN
- 9789819664177
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 1.9.2025
- Kustantaja
- Springer Nature Switzerland AG
- Sivumäärä
- 274
