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Advances in Imaging and Electron Physics
Tallenna

Advances in Imaging and Electron Physics

sidottu, 2012
englanti
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Alaotsikko
Silicon-Based Millimetre-wave Technology
Toimittaja
Jamal Deen
ISBN
9780123942982
Kieli
englanti
Paino
760 grammaa
Julkaisupäivä
31.12.2012
Sivumäärä
484