Tallenna
Advanced Transmission Electron Microscopy
As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy.
- Alaotsikko
- Imaging and Diffraction in Nanoscience
- Kirjailija
- Jian Min Zuo, John C.H. Spence
- Painos
- Softcover reprint of the original 1st ed. 2017
- ISBN
- 9781493982493
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 23.6.2018
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 729
