Tallenna
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Kirjailija:
nidottu, 2013
englanti
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972.
- Kirjailija
- Patrick Echlin, C.E. Fiori, Joseph Goldstein, David C. Joy, Dale E. Newbury
- Painos
- Softcover reprint of the original 1st ed. 1986
- ISBN
- 9781475790290
- Kieli
- englanti
- Paino
- 310 grammaa
- Julkaisupäivä
- 8.6.2013
- Kustantaja
- Springer-Verlag New York Inc.
- Sivumäärä
- 454
