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A Designer’s Guide to Built-In Self-Test
Tallenna

A Designer’s Guide to Built-In Self-Test

The BIST approaches include the Built-In Logic Block Observer, pseudo-exhaustive BIST techniques, Circular BIST, scan-based BIST, BIST for regular structures, BIST for FPGAs and CPLDs, mixed-signal BIST, and the integration of BIST with concurrent fault detection techniques for on-line testing.
Painos
Softcover reprint of the original 1st ed. 2002
ISBN
9781475776263
Kieli
englanti
Paino
310 grammaa
Julkaisupäivä
18.3.2013
Sivumäärä
320