Over the past decade, reducing the dynamic switching power was the main focus in many of the proposed low-power circuit techniques. At that time, the off-state leakage power was negligible compared to dynamic power. However, as technology scales into the deep-submicron regime, the increase in leakage power can no longer be neglected. Soon, the biggest challenge that SoC designers must resolve is the fact that transistors for digital and memory circuits will be more and more leaky as technology generations advance. The semiconductor industry must therefore reduce leakage current in chip designs by two orders of magnitude over the next ten years, or face an interruption in projected chip complexity. Failure to do so would make the mounting leakage current the "e;big stumbling block to Moore's Law"e;. Furthermore, cooperative approaches between computer-aided design development, circuit design, and technology process must be examined. Multi-Threshold CMOS Digital Circuits Managing Leakage Power discusses the Multi-threshold voltage CMOS (MTCMOS) technology, that has emerged as an increasingly popular technique to control the escalating leakage power, while maintaining high performance. The book addresses the leakage problem in a number of designs for combinational, sequential, dynamic, and current-steering logic. Moreover, computer-aided design methodologies for designing low-leakage integrated circuits are presented. The book give an excellent survey of state-of-the-art techniques presented in the literature as well as proposed designs that minimize leakage power, while achieving high-performance. Multi-Threshold CMOS Digital Circuits Managing Leakage Power is written for students of VLSI design as well as practicing circuit designers, system designers, CAD tool developers and researchers. It assumes a basic knowledge of digital circuit design and device operation, and covers a broad range of circuit design techniques.