Siirry suoraan sisältöön
Handbook of Charged Particle Optics
Handbook of Charged Particle Optics
Tallenna

Handbook of Charged Particle Optics

Lue Adobe DRM-yhteensopivassa e-kirjojen lukuohjelmassaTämä e-kirja on kopiosuojattu Adobe DRM:llä, mikä vaikuttaa siihen, millä alustalla voit lukea kirjaa. Lue lisää
With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments.The book's unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field's cutting-edge technologies with added insight into how they work.Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.
Toimittaja
Jon Orloff
ISBN
9781420045550
Kieli
englanti
Julkaisupäivä
19.12.2017
Kustantaja
CRC PRESS
Formaatti
  • PDF - Adobe DRM
Lue e-kirjoja täällä
  • Lue e-kirja mobiililaitteella/tabletilla
  • Lukulaite
  • Tietokone