Spara
Testing and Diagnosis of VLSI and ULSI
High Density technologies such as Very-Large Scale Integration (VLSI), Wafer Scale Integration (WSI) and the not-so-far promises of Ultra-Large Scale Integration (ULSI), have exasperated the problema associated with the testing and diagnosis of these devices and systema.
- Redaktör
- F. Lombardi, M.G. Sami
- Upplaga
- Softcover reprint of the original 1st ed. 1988
- ISBN
- 9789401071345
- Språk
- Engelska
- Vikt
- 310 gram
- Utgivningsdatum
- 2011-09-28
- Förlag
- Springer
- Sidor
- 544
